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GB/T 29057-2023 Active
GB/T 29057-2023 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
Abstract
This document specifies the procedures for sampling polycrystalline silicon rods, zone melting the samples to form single crystals, and analyzing the drawn single-crystal silicon rods by low-temperature infrared spectroscopy or photoluminescence spectroscopy to determine the dopant, acceptor, substitutional carbon, and interstitial oxygen impurity contents in polycrystalline silicon. This document is applicable to the evaluation of rod-shaped polycrystalline silicon deposited and grown on a silicon substrate.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 29057-2023 |
| CCS | Semi-metals and semiconductor materials |
| ICS | \nMetal material testing |
| Implement Date | 2024-03-01 |
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