GB/T 4855-1984
Abolished
GB/T 36477-2018
Active
National standards
GB/T 36477-2018 Semiconductor integrated circuit—Measuring methods for flash memory
GB/T 36477-2018 Semiconductor integrated circuit—Measuring methods for flash memory
Basic Information
Standard Code:
GB/T 36477-2018
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2018-06-07
Implement Date:
2019-01-01
Pages:
18 pages
Scope
This standard specifies the basic methods for testing the electrical parameters, timing parameters, and functionalities of storage units in semiconductor integrated circuits' flash memory devices.
This standard is applicable to the testing of electrical parameters, timing parameters, and the functionality of storage units in the field of semiconductor integrated circuits' flash memory devices.
Development Information
Referenced Standards
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished