GB/T 11498-2018 Semiconductor devices—Integrated circuits—Part 21:Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures

Scope

This part of the "Semiconductor Devices and Integrated Circuits" standard applies to film integrated circuits and hybrid film integrated circuits manufactured as catalog circuits or customized circuits, the quality of which is evaluated based on qualification and approval.
The purpose of this part is to provide priority values for rated values and characteristics, select appropriate test and measurement methods from the general specification, and provide general performance requirements for the detailed specification of film integrated circuits and hybrid film integrated circuits developed in accordance with this part.
The concept of priority values is directly applied to catalog circuits, but it is not necessary to apply it to customized circuits.
The test severity levels and requirements specified in the detailed specification developed in accordance with this part may be equal to or higher than the performance level of the sub-specification, and a lower performance level is not allowed.
There are one or more blank detailed specifications associated with this part, each of which is given a number. By filling in the blank detailed specifications in accordance with the provisions of 2.3, a detailed specification is formed. According to the provisions of the IECQ system, such detailed specifications can be used for the granting of qualification and approval and for quality consistency testing of film integrated circuits and hybrid film integrated circuits.

Development Information

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