GB/T 25186-2010 Active National standards

GB/T 25186-2010 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of relative sensitivity factors from ion-implanted reference materials

Publish Date: 2010-09-26 Implement Date: 2011-08-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 25186-2010

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Basic standards and general methods

ICS Name: Chemical analysis

Publish Date: 2010-09-26

Implement Date: 2011-08-01

Pages: 6 pages

Scope

This standard specifies a method for determining the relative sensitivity factor in secondary ion mass spectrometry analysis by ion implantation of reference materials.
This standard is applicable to samples with a single chemical composition of the matrix, where the peak atomic concentration of the implanted material does not exceed 1%.