JJF 1613-2017 Active National Metrology Technical Specifications JJF

JJF 1613-2017 Calibration Specification for Thin Film Thickness Measurement Instruments by Grazing Incidence X-Ray Reflectivity

Publish Date: 2017-02-28 Implement Date: 2017-05-28 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: JJF 1613-2017

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: -

ICS Name: -

Publish Date: 2017-02-28

Implement Date: 2017-05-28

Pages: 20 pages

Scope

This specification is applicable to the calibration of X-ray reflectometry instruments for measuring the thickness of incident-angle X-ray reflective films (hereinafter referred to as "instruments").

Development Information

Word Count: 19 Thousand words Pages: 20 pages

Referenced Standards

JJG 629-2014 Polycrystalline X-Ray Diffractometers JJF 1071-2010 The Rules for Drafting National Calibration Specification

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