GB/T 1423-1996
Active
GB/T 26074-2010
Active
National standards
GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
Basic Information
Standard Code:
GB/T 26074-2010
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Analysis methods for semi-metallic and semiconductor materials
ICS Name:
Other testing methods for metal materials
Publish Date:
2011-01-10
Implement Date:
2011-10-01
Pages:
7 pages
Scope
This standard specifies the method of measuring the resistivity of germanium single crystals using the DC four-probe method.
This standard is applicable to measuring the resistivity of germanium single crystals with a sample thickness and a distance from the edge of the sample to any probe endpoint that are both greater than four times the probe spacing, as well as measuring the resistivity of germanium single crystal wafers with a diameter greater than ten times the probe spacing and a thickness less than four times the probe spacing (referred to as wafers). The measurement range is 1×10-3Ω·cm to 1×102Ω·cm.
Development Information
Related Standards
GB/T 1424-1996
Active
GB/T 1424-1996 Method of measurement of resistivity of precious metals and their alloys
GB/T 1425-1996
Replaced
GB/T 1425-1996 Determination of melting temperature range for precious metals and their alloys—Testing method of thermal analysis
GB/T 17433-1998
Replaced
GB/T 17433-1998 Foundation terms for chemical analysis of metallurgical products
GB/T 4334.1-2000
Replaced
GB/T 4334.1-2000 Method of 10 per cent oxalic acid etch test for stainless steels
GB/T 4334.2-2000
Replaced