GB/T 4855-1984
Abolished
GB/T 42968.2-2024
Active
National standards
GB/T 42968.2-2024 Integrated circuits—Measurement of electromagnetic immunity—Part 2:Measurement of radiated immunity—TEM cell and wideband TEM cell method
GB/T 42968.2-2024 Integrated circuits—Measurement of electromagnetic immunity—Part 2:Measurement of radiated immunity—TEM cell and wideband TEM cell method
Basic Information
Standard Code:
GB/T 42968.2-2024
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2024-10-26
Implement Date:
2024-10-26
Pages:
22 pages
Scope
This document describes the method of measuring the immunity of integrated circuits (ICs) to electromagnetic interference from radio frequency (RF) radiation. The frequency range applicable to this document is 150 kHz to 1 GHz, or the frequency range determined by the characteristics of the TEM chamber and the wideband TEM chamber.
Development Information
Same series standard
Referenced Standards
IEC 60050-131
IEC 60050-161
IEC 61967-2
IEC 62132-1:2006
Adopt standards
IEC 62132-2:2010
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished