GB/T 10406.1-1989
Abolished
SJ/T 11820-2022
Active
Industry standards-Electronics
SJ/T 11820-2022 Semiconductor discrete device DC parameter testing equipment technical requirements and measurement methods
SJ/T 11820-2022 Semiconductor discrete device DC parameter testing equipment technical requirements and measurement methods
Basic Information
Standard Code:
SJ/T 11820-2022
Standard Type:
Industry standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic measurement and instruments
ICS Name:
Electronics, magnetism, and the measurement of electricity and magnetism.
Publish Date:
2022-10-20
Implement Date:
2023-01-01
Scope
This device is suitable for testing discrete components with a DC voltage output and measurement range of no more than 0.01 V to 5,000 V, a DC current output and measurement range of no more than 1 nA to 10 A, and a pulse current output and measurement range of no more than 10 A to 1,200 A.
Development Information
Related Standards
GB/T 10407-1989
Abolished
GB/T 10407-1989 General purpose specification of filar suspension magnetometer
GB/T 12190-1990
Replaced
GB/T 12190-1990 Measurement of shielding effectiveness of high-performance shielding enclosures
GB/T 13637-1992
Replaced
GB/T 13637-1992 DDZ-Ⅲ series process electronic control system—Indicating instrument
GB/T 3408-1994
Replaced
GB/T 3408-1994 Unbonded elastic wire resistance type strain meter
GB/T 3409-1994
Replaced