GB/T 2413-1981
Active
GB/T 5593-2015
Active
National standards
GB/T 5593-2015 Structure ceramic materials used in electronic component and device
GB/T 5593-2015 Structure ceramic materials used in electronic component and device
Basic Information
Standard Code:
GB/T 5593-2015
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electronic devices and specialized materials, parts, and structural components
ICS Name:
Special materials for electronic technology
Publish Date:
2015-05-15
Implement Date:
2016-01-01
Pages:
16 pages
Scope
This standard specifies the types, grades, technical requirements, test methods, and inspection rules for structural ceramics used in electronic components. This standard is applicable to structural ceramic materials used in electronic components.
Development Information
Replace the following standards
Referenced Standards
GB/T 1031-1995 Surface roughness parameters and their values
GB/T 9530-1988
JJG 151-2006 Metallic Vickers Hardness Testers
GB/T 1966-1996 Test method for apparent porosity and bulk density of porous ceramic
GB/T 1966-2024 Porous ceramics—Determination of apparent porosity and bulk density
GB/T 2413-1981 Piezoelectric ceramic materials—Measuring methods for determination of volume density
GB/T 2421.1-2008 Environmental testing for electric and electronic products—General and guidance
GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components—Test method for gas-tightness
GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio
GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion
GB/T 5594.3-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 3:Test method for mean coefficient of linear expansion
GB/T 5594.4-1985 Test methods for properties of structure ceramic used in electronic components—Test method for dielectric loss angle tangent value
GB/T 5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device—Part 4:Test method for permittivity and dielectric loss angle tangent value
GB/T 5594.5-1985 Test methods for properties of structure ceramic used in electronic components—Test method for volume resistivity
GB/T 5594.6-1985 Test methods for properties of structure ceramic used in electronic components—Test method for chemical durability
GB/T 5594.6-2015 Test methods for properties of structure ceramics used in electronic component and device—Part 6:Test method for chemical durability
GB/T 5594.7-1985 Test methods for properties of structure ceramic used in electronic components—Test method for liquid permeability
GB/T 5594.7-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 7:Test method for liquid permeability
GB/T 5594.8-1985 Test methods for properties of structure ceramic used in electronic components—Determination of microstructure
GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device—Part 8:Test method for microstructure
GB/T 5597-1999 Test method for complex permittivity of solid dielectric materials at microwave frequencies
GB/T 5598-1985 Test method for thermal conductivity of beryllium oxide ceramics
GB/T 5598-2015 Test method for thermal conductivity of beryllium oxide ceramics
SJ/T 10760-1996 Designations for names and models of structure ceramic materials for electronic components
Related Standards
GB/T 3389.4-1982
Replaced
GB/T 3389.4-1982 Test methods for the properties of piezoelectric ceramics—Longitudinal length extension vibration mode for rod
GB/T 5594.1-1985
Active
GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components—Test method for gas-tightness
GB/T 5594.2-1985
Active
GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio
GB/T 5594.3-1985
Replaced
GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion
GB/T 5594.4-1985
Replaced