GB/T 5593-2015 Active National standards

GB/T 5593-2015 Structure ceramic materials used in electronic component and device

GB/T 5593-2015 Structure ceramic materials used in electronic component and device

Publish Date: 2015-05-15 Implement Date: 2016-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 5593-2015
Standard Type: National standards
Standard Status: Active
is_force_gb: no
CCS Name: Electronic devices and specialized materials, parts, and structural components
ICS Name: Special materials for electronic technology
Publish Date: 2015-05-15
Implement Date: 2016-01-01
Pages: 16 pages

Scope

This standard specifies the types, grades, technical requirements, test methods, and inspection rules for structural ceramics used in electronic components. This standard is applicable to structural ceramic materials used in electronic components.

Development Information

Word Count: 30 Thousand words Pages: 16 pages

Replace the following standards

Referenced Standards

GB/T 1031-1995 Surface roughness parameters and their values GB/T 9530-1988 JJG 151-2006 Metallic Vickers Hardness Testers GB/T 1966-1996 Test method for apparent porosity and bulk density of porous ceramic GB/T 1966-2024 Porous ceramics—Determination of apparent porosity and bulk density GB/T 2413-1981 Piezoelectric ceramic materials—Measuring methods for determination of volume density GB/T 2421.1-2008 Environmental testing for electric and electronic products—General and guidance GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components—Test method for gas-tightness GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion GB/T 5594.3-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 3:Test method for mean coefficient of linear expansion GB/T 5594.4-1985 Test methods for properties of structure ceramic used in electronic components—Test method for dielectric loss angle tangent value GB/T 5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device—Part 4:Test method for permittivity and dielectric loss angle tangent value GB/T 5594.5-1985 Test methods for properties of structure ceramic used in electronic components—Test method for volume resistivity GB/T 5594.6-1985 Test methods for properties of structure ceramic used in electronic components—Test method for chemical durability GB/T 5594.6-2015 Test methods for properties of structure ceramics used in electronic component and device—Part 6:Test method for chemical durability GB/T 5594.7-1985 Test methods for properties of structure ceramic used in electronic components—Test method for liquid permeability GB/T 5594.7-2015 Test methods for properties of structure ceramicused in electronic components and device—Part 7:Test method for liquid permeability GB/T 5594.8-1985 Test methods for properties of structure ceramic used in electronic components—Determination of microstructure GB/T 5594.8-2015 Test methods for properties of structure ceramic used in electronic components and device—Part 8:Test method for microstructure GB/T 5597-1999 Test method for complex permittivity of solid dielectric materials at microwave frequencies GB/T 5598-1985 Test method for thermal conductivity of beryllium oxide ceramics GB/T 5598-2015 Test method for thermal conductivity of beryllium oxide ceramics SJ/T 10760-1996 Designations for names and models of structure ceramic materials for electronic components

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