GB/T 2413-1981
Active
DB1310/T 227-2020
Abolished
Hebei ProvinceLocal standards
DB1310/T 227-2020 Electronic special material monocrystalline silicon growth quartz crucible process technical specification
DB1310/T 227-2020 Electronic special material monocrystalline silicon growth quartz crucible process technical specification
Basic Information
Standard Code:
DB1310/T 227-2020
Standard Type:
Local standards
Standard Status:
Abolished
is_force_gb:
no
CCS Name:
Electronic devices and specialized materials, parts, and structural components
ICS Name:
Special materials for electronic technology
Publish Date:
2020-10-16
Implement Date:
2020-11-16
Pages:
7 pages
Scope
This document is applicable to the process technology of quartz crucibles used for growing monocrystalline silicon, a specialized electronic material
Development Information
Related Standards
GB/T 3389.4-1982
Replaced
GB/T 3389.4-1982 Test methods for the properties of piezoelectric ceramics—Longitudinal length extension vibration mode for rod
GB/T 5594.1-1985
Active
GB/T 5594.1-1985 Test methods for properties of structure ceramic used in electronic components—Test method for gas-tightness
GB/T 5594.2-1985
Active
GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio
GB/T 5594.3-1985
Replaced
GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion
GB/T 5594.4-1985
Replaced