YS/T 716.6-2009 Active Industry standards-Non-ferrous metals

YS/T 716.6-2009 Methods for chemical analysis of low grade blister—Part 6:Determination of arsenic,bismuth,nickel,lead,antimony,tin and zinc contents—Inductively coupled plasma-atomic emission spectrometry

Publish Date: 2009-12-04 Implement Date: 2010-06-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 716.6-2009

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Analysis methods for heavy metals and their alloys

ICS Name: Chemical analysis of metal materials

Publish Date: 2009-12-04

Implement Date: 2010-06-01

Pages: 6 pages

Scope

This part of YS/T 716 specifies the determination methods for the contents of arsenic, bismuth, nickel, lead, antimony, tin, and zinc in black copper. This part is applicable to the determination of arsenic, bismuth, nickel, lead, antimony, tin, and zinc in black copper (80.00% to 95.00%), and the determination range is shown in Table 1:

Development Information

Word Count: 9 Thousand words Pages: 6 pages

Same series standard

YS/T 716.1-2009 Methods for chemical analysis of low grade blister—Part 1:The determination of copper content—Sodium hyposulfite titration YS/T 716.2-2009 Methods for chemical analysis of low grade blister—Part 2:The determination of gold and silver contents—Fire assaying method YS/T 716.3-2009 Methods for chemical analysis of low grade blister—Part 3:Determination of bismuth,nickel,lead,antimony and zinc contents—Flame atomic absorption spectrometry YS/T 716.4-2009 Methods for chemical analysis of low grade blister—Part 4:Determination of arsenic content—Iodimetry YS/T 716.5-2009 Methods for chemical analysis of low grade blister—Part 5:Determination of tin content—Potassium iodate titration

Related Standards

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Publish Date: 1982-06-21

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Publish Date: 1983-02-21

GB/T 3489-1983 Replaced

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Publish Date: 1983-02-21

GB/T 3651-1983 Replaced

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Publish Date: 1983-05-02

GB/T 4059-1983 Replaced

GB/T 4059-1983 Polycrystalline silicon—Examination method—Zone-melting on phosphorus under controlled atmosphere

Publish Date: 1983-12-20