GB/T 4855-1984
Abolished
GB/T 13062-2018
Active
National standards
GB/T 13062-2018 Semiconductor devices—Integrated circuits—Part 21-1:Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
GB/T 13062-2018 Semiconductor devices—Integrated circuits—Part 21-1:Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
Basic Information
Standard Code:
GB/T 13062-2018
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
\nMembrane integrated circuit
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2018-12-28
Implement Date:
2019-07-01
Pages:
12 pages
Scope
The IEC electronic component quality assessment system follows the IEC charter and operates under the authorization of the IEC. The purpose of this system is to establish a quality assessment procedure, so that electronic components released by a participating country in accordance with relevant standards can be accepted by all other participating countries without further testing.
When formulating detailed specifications, the content of section 3.5 in the general specification and sections 2.3 and 3.2 in the sub-specification will be taken into account.
Development Information
Replace the following standards
Adopt standards
IEC 60748-21-1:1997
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished