GB/T 43034.2-2024 Integrated circuits—Measurement of impulse immunity—Part 2:Synchronous transient injection method

Scope

This document provides general information and definitions for evaluating the immunity of integrated circuits (ICs) to fast transient electromagnetic interference (EMI) disturbance test methods. This information includes test conditions, test equipment, test setup, test procedures, and the content requirements of test reports. The purpose of this document is to describe the general conditions for obtaining quantitative measurements of IC immunity by establishing a consistent test environment, while also describing the key parameters that are expected to affect the test results. Any deviations from this document must be clearly indicated in the test report. The synchronous transient immunity measurement method described in this document uses short pulses with different amplitudes, durations, and polarities, and a fast rise time, which are coupled to the IC by conduction. In this method, the applied pulses must be synchronized with the functional operation of the IC to ensure controllable and reproducible conditions.

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