SJ 2354.13-1983 Method of measurement for multiplication factor of PIN and avalanche photodiodes

SJ 2354.1-1983 General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes SJ 2354.2-1983 Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes SJ 2354.3-1983 Method of measurement for dark current of PIN and avalanche photodiodes SJ 2354.4-1983 Method of measurement for forward voltage drop of PIN and avalanche photodiodes SJ 2354.5-1983 Method of measurement for capacitance of PIN and avalanche photodiodes SJ 2354.6-1983 Method of measurement for responsivity of PIN and avalanche photodiodes SJ 2354.7-1983 Method of measurement for spectral response curve and spectral response range of PIN and avalanche photodiodes SJ 2354.8-1983 Method of measurement for pulse rise time and fall time of PIN and avalanche photodiodes SJ 2354.9-1983 Method of measurement for noise equivalent power of PIN and avalanche photodiodes SJ 2354.10-1983 Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix SJ 2354.11-1983 Method of measurement for width of blind zone of PIN and avalanche photodiode matrix SJ 2354.12-1983 Method of measurement for temperature factor of reverse breakdown voltage of PIN and avalanche photodiodes SJ 2354.14-1983 Method of measurement for excess noise factor of PIN and avalanche photodiodes

SJ/T 2354-2015 Pin and avalanche photodiode testing methods