YS/T 666-2008 Active Industry standards-Non-ferrous metals

YS/T 666-2008 Chemical analysis methods of gallium for industrial use—Determination of impurity elements—Inductively coupled plasma atomic emission spectrometric method

YS/T 666-2008 Chemical analysis methods of gallium for industrial use—Determination of impurity elements—Inductively coupled plasma atomic emission spectrometric method

Publish Date: 2008-03-12 Implement Date: 2008-09-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: YS/T 666-2008
Standard Type: Industry standards
Standard Status: Active
is_force_gb: no
CCS Name: Analysis methods for light metals and their alloys
ICS Name: Other non-ferrous metals and their alloys
Publish Date: 2008-03-12
Implement Date: 2008-09-01
Pages: 6 pages

Scope

This standard specifies the determination methods for the silicon, sodium, potassium, magnesium, calcium, and aluminum contents in industrial gallium. This standard is applicable to the determination of silicon, sodium, potassium, magnesium, calcium, and aluminum contents in industrial gallium [99.9% ≤ω(%)≤99.995%]. The determination range is shown in Table 1.

Development Information

Word Count: 8 Thousand words Pages: 6 pages

Referenced Standards

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