GB/T 45505.3-2025 Active National standards

GB/T 45505.3-2025 Test method of flat panel display glass substrate—Part 3:Thermal properties

Publish Date: 2025-08-01 Implement Date: 2026-02-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 45505.3-2025

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Electronic devices and specialized materials, parts, and structural components

ICS Name: Special materials for electronic technology

Publish Date: 2025-08-01

Implement Date: 2026-02-01

Pages: 16 pages

Scope

This document describes the measurement methods for the annealing point, strain point, softening point, average linear thermal expansion coefficient, thermal conductivity, and reheat shrinkage rate of substrate glass used in flat-panel displays.
This document is applicable to the thermal performance testing of all types of substrate glass used in flat-panel displays.

Development Information

Word Count: 25 Thousand words Pages: 16 pages

Same series standard

GB/T 45505.1-2025 Test method of flat panel display glass substrate—Part 1:Appearance and geometric dimensions GB/T 45505.2-2025 Test method of flat panel display glass substrate—Part 2:Surface properties GB/T 45505.4-2025 Test methods of flat panel display glass substrate—Part 4:Mechanical properties GB/T 45505.5-2025 Test method of flat panel display glass substrate—Part 5:Photoelectric performance

Referenced Standards

GB/T 1216-1985 Micrometers GB/T 1216-2004 external micrometer GB/T 1216-2018 External micrometer GB/T 16920-2015 Glass—Determination of coefficient of mean linear thermal expansion GB/T 21389-2008 Vernier,dial and digital display calipers GB/T 38711-2020 Test method for reheating shrinkage of ultrathin glass—Laser method GB/T 38712-2020 Test method for thermal conductivity of ultrathin glass—Heat flow method

Related Standards

GB/T 2413-1981 Active

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Publish Date: 1980-12-31

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GB/T 5594.1-1985 Active

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GB/T 5594.2-1985 Active

GB/T 5594.2-1985 Test methods for properties of structure ceramic used in electronic components—Test method for Youngs elastic modulus and Poisson ratio

Publish Date: 1985-11-27

GB/T 5594.3-1985 Replaced

GB/T 5594.3-1985 Test methods for properties of structure ceramic used in electronic components—Test method for mean coefficient of linear expansion

Publish Date: 1985-11-27

GB/T 5594.4-1985 Replaced

GB/T 5594.4-1985 Test methods for properties of structure ceramic used in electronic components—Test method for dielectric loss angle tangent value

Publish Date: 1985-11-27