GB/T 14849.4-2008 Replaced National standards

GB/T 14849.4-2008 Methods for chemical analysis of silicon metal—Part 4:Determination of elements content Inductively coupled plasma atomic emission spectrometric method

GB/T 14849.4-2008 Methods for chemical analysis of silicon metal—Part 4:Determination of elements content Inductively coupled plasma atomic emission spectrometric method

Publish Date: 2008-06-09 Implement Date: 2008-12-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: GB/T 14849.4-2008
Standard Type: National standards
Standard Status: Replaced
is_force_gb: no
CCS Name: Analysis methods for semi-metallic and semiconductor materials
ICS Name: Aluminum and aluminum alloys
Publish Date: 2008-06-09
Implement Date: 2008-12-01
Pages: 6 pages

Scope

This section specifies the determination methods for the iron, aluminum, calcium, titanium, manganese, and nickel contents in industrial silicon. This section is applicable to the determination of the iron, aluminum, calcium, titanium, manganese, and nickel contents in industrial silicon. The determination range is shown in Table 1.

Development Information

Word Count: 9 Thousand words Pages: 6 pages

Superseded by the following standards

Related Standards

Contact Us