GB/T 17799.2-2003
Replaced
GB/T 17626.19-2022
Active
National standards
GB/T 17626.19-2022 Electromagnetic compatibility—Testing and measurement techniques—Part 19:Test for immunity to conducted,differential mode disturbances and signaling in the frequency range 2 kHz to 150 kHz at a.c. power ports
GB/T 17626.19-2022 Electromagnetic compatibility—Testing and measurement techniques—Part 19:Test for immunity to conducted,differential mode disturbances and signaling in the frequency range 2 kHz to 150 kHz at a.c. power ports
Basic Information
Standard Code:
GB/T 17626.19-2022
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Electromagnetic compatibility
ICS Name:
\nImmunity to interference
Publish Date:
2022-12-30
Implement Date:
2023-07-01
Publisher:
国家市场监督管理总局、国家标准化管理委员会
Technical Committee:
全国电磁兼容标准化技术委员会(SAC/TC 246)
Pages:
29 pages
Scope
本文件规定了电气和电子设备对交流电源端口2 kHz~150 kHz差模传导骚扰和通信信号的抗扰度要求和试验方法。
本文件的目的是建立电气和电子设备交流电源端口经受差模传导骚扰和通信信号试验的通用和可重复性准则。本文件规定了:
——试验波形;
——试验等级范围;
——试验设备;
——试验布置;
——试验程序;
——验证程序。
本文件的规定旨在确认电气和电子设备在电压不高于220 V(相线-中线;如果没有中线时为相线-地线)、频率为50 Hz的供电电源下工作时,承受来自诸如电力电子、电力线通信系统(PLC)等差模传导骚扰的抗扰度。
交流电源端口不高于2 kHz的谐波、间谐波以及载波通信的差模抗扰度按照GB/T 17626.13。
2 kHz~150 kHz频率范围的发射通常既包括差模分量也包括共模分量。本文件只针对差模骚扰和通信信号规定抗扰度试验。对于共模试验,见IEC 61000-4-16。
Development Information
Drafting Units:
中国电子技术标准化研究院、中国电力科学研究院有限公司、苏州泰思特电子科技有限公司、上海市计量测试技术研究院
Drafting Persons:
陈世钢、万保权、尹婷、胡小军、李妮、赵文晖、付君、朱赛
Referenced Standards
Adopt standards
IEC 61000-4-19:2014
Related Standards
GB/T 17626.14-2005
Active
GB/T 17626.14-2005 Electromagnetic compatibility—Testing and measurement techniques—Voltage fluctuation immunity test
GB/T 17626.17-2005
Active
GB/T 17626.17-2005 Electromagnetic Compatibility—Testing and measurement techniques—Ripple on d.c.input power port immunity test
GB/T 17626.2-2006
Replaced
GB/T 17626.2-2006 Electromagnetic compatibility—Testing and measurement techniques—Electrostatic discharge immunity test
GB/T 17626.29-2006
Active
GB/T 17626.29-2006 Electromagnetic compatibility—Testing and measurement techniques—Voltage dips, short interruptions and voltage variations on d.c .input power port immunity tests
GB/T 17626.3-2006
Replaced