SJ/T 11632-2016 Active Industry standards-Electronics

SJ/T 11632-2016 Testing method for micro-crack defects in silicon wafers used in solar cells

Publish Date: 2016-04-05 Implement Date: 2016-09-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Basic Information

Standard Code: SJ/T 11632-2016

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: \nTest methods for the physical properties of metals

ICS Name: \nMetal material testing

Publish Date: 2016-04-05

Implement Date: 2016-09-01

Pages: 9 pages

Development Information

Pages: 9 pages

Related Standards

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Publish Date: 1983-05-02

GB/T 3657-1983 Replaced

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Publish Date: 1983-05-02

GB/T 3849-1983 Replaced

GB/T 3849-1983 Hardmetals—Rockwell hardness (scale A) test method

Publish Date: 1983-09-14

GB/T 3850-1983 Replaced

GB/T 3850-1983 Impermeable sintered metal materials and hardmetals—determination of density

Publish Date: 1983-09-14

GB/T 3851-1983 Replaced

GB/T 3851-1983 Hardmetals—determination of transverse rupture strength

Publish Date: 1983-09-14

GB/T 4326-1984 Replaced

GB/T 4326-1984 Extrinsic semiconductor single crystals—measurement of Hall mobility and Hall coefficient

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