GB/T 22319.6-2023 Measurement of quartz crystal unit parameters—Part 6:Measurement of drive level dependence (DLD)
GB/T 22319.6-2023 Measurement of quartz crystal unit parameters—Part 6:Measurement of drive level dependence (DLD)
Basic Information
Scope
This document is applicable to the measurement of the dependency of the excitation level (DLD) of quartz crystal components. This document specifies two test methods (A and C) and one reference measurement method (Method B). Method A is based on the π-type network of IEC 604445 and is suitable for the entire frequency range covered by this document. The reference measurement method B is based on the π-type network or reflection method of IEC 604445 or IEC 604448 and is suitable for the entire frequency range covered by this document. Method C is an oscillator method, suitable for the measurement of a large number of fundamental frequency quartz crystal components under fixed conditions. Note: The measurement methods specified in this document are not only applicable to AT-cut types, but also to other crystal cuts and vibration modes, such as double angle cuts and vibration modes (IT, SC) and tuning fork crystal components (by using high-impedance test fixtures).