GB/T 43034.3-2023 Active National standards

GB/T 43034.3-2023 Integrated circuits—Measurement of impulse immunity—Part 3:Non-synchronous transient injection method

Publish Date: 2023-09-07 Implement Date: 2024-01-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: GB/T 43034.3-2023

Standard Type: National standards

Standard Status: Active

is_force_gb: no

CCS Name: Semiconductor integrated circuits

ICS Name: Integrated circuits, microelectronics

Publish Date: 2023-09-07

Implement Date: 2024-01-01

Pages: 28 pages

Scope

This document specifies the immunity measurement method for integrated circuits (ICs) against standard conducted electrical transient disturbances. Disturbances that are not synchronized with the operation of the device under test (DUT) are applied to the IC pins through a coupling network. Regardless of whether the electrical transient disturbances are within the specified operating voltage range of the IC, this method can obtain the correlation between the conducted electrical transient disturbances and the degradation of IC performance caused by them, and classify them accordingly.

Development Information

Word Count: 56 Thousand words Pages: 28 pages

Referenced Standards

GB/T 17626.4-2018 Electromagnetic compatibility—Testing and measurement techniques—Electrical fast transient/burstimmunity test GB/T 17626.5-2019 Electromagnetic compatibility—Testing and measurement techniques—Surge immunity test ISO 7637-2:2011 IEC 60050-131 IEC 60050-161 IEC 62132-4:2006

Adopt standards

IEC 62215-3:2013

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