GB/T 4855-1984
Abolished
GB/T 4377-2018
Active
National standards
GB/T 4377-2018 Semiconductor integrated circuits—Measuring method of voltage regulators
GB/T 4377-2018 Semiconductor integrated circuits—Measuring method of voltage regulators
Basic Information
Standard Code:
GB/T 4377-2018
Standard Type:
National standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Semiconductor integrated circuits
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2018-03-15
Implement Date:
2018-08-01
Pages:
26 pages
Scope
This standard specifies the test methods for the parameters of voltage regulators (hereinafter referred to as devices). This standard is applicable to the testing of voltage regulator parameters in the field of semiconductor integrated circuits.
Development Information
Replace the following standards
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished