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GB/T 19501-2013 Active
GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
Abstract
This standard specifies the method of electron backscattered diffraction analysis.
This standard is applicable to scanning electron microscopes and electron probes equipped with electron backscattered diffraction attachments for analysis in aspects such as material phase identification, crystal orientation, microstructures, and grain boundary characteristics.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 19501-2013 |
| CCS | Basic standards and general methods |
| ICS | Physicochemical analysis methods |
| Implement Date | 2014-03-01 |
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