GB/T 38532-2020 Active
GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
Abstract
This standard specifies the method for determining the average grain size of polished sections using electron backscattered diffraction (EBSD), including the measurement requirements for orientation, orientation difference, and pattern quality factor related to the position in the crystal sample [1].
Note 1: The use of optical microscopy to determine grain size has been widely accepted. Compared with this method, EBSD has many technical advantages, such as high spatial resolution and quantitative description of grain orientation.
Note 2: This method can also be used for grain size measurement of some complex materials (such as duplex materials).
Note 3: When analyzing samples with a high degree of deformation, the results should be handled with caution.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 38532-2020 |
| CCS | Basic standards and general methods |
| ICS | Chemical analysis |
| Implement Date | 2021-02-01 |