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GB/T 24579-2009 Active

GB/T 24579-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy

Available format(s)
PDF
Language(s)
Chinese
Publish Date
2009-10-30

General Product Information

Document Type National standards
Standard Status Active
Standard Code GB/T 24579-2009
CCS Semi-metals and semiconductor materials
ICS Semiconductor materials
Implement Date 2010-06-01
Price $ 36.00
Subtotal $ 36.00
Tax $ 0.00
Order Total (incl. tax) $ 36.00

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