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GB/T 4937.23-2023 Active
GB/T 4937.23-2023 Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life
Abstract
This document describes the test method for studying the impact of bias conditions and temperature on solid-state devices over time. The test simulates the operation of devices in an accelerated life mode and is primarily used for device qualification and reliability testing. Short-term high-temperature bias life testing, commonly referred to as aging, can be used to screen out products with early failures during the selection process. This document does not specify detailed requirements or applications for aging testing.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4937.23-2023 |
| CCS | Semiconductor discrete devices |
| ICS | Integrated Components of Semiconductor Devices |
| Implement Date | 2023-12-01 |
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