GB/T 45772-2025 Active
GB/T 45772-2025 Surface chemical analysis—Electron spectroscopies—Procedures for identifying,estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
Abstract
This document specifies the requirements for the identification, evaluation, and correction of unintended damage to the elemental composition or chemical state of samples caused by X-ray irradiation in X-ray photoelectron spectroscopy (XPS) analysis.
This document only applies to unintended damage caused by X-rays, resulting in a decrease or increase in the intensity of photoelectron spectra by less than 30%. This document does not involve comparisons between different types of materials, nor does it address the mechanism, depth, or chemical nature of the damage that occurs.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 45772-2025 |
| CCS | Basic standards and general methods |
| ICS | Chemical analysis |
| Implement Date | 2026-01-01 |