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GB/T 23413-2009 Active
GB/T 23413-2009 Determination of crystallite size and micro-strain of nano-materials—X-ray diffraction line broadening method
Abstract
This standard specifies a method for determining the grain size and microscopic strain of nanomaterials using the X-ray diffraction line broadening method. The calculation method adopted in this standard is the approximate function method.
This standard is applicable to the determination of grain sizes generally not exceeding 100 nm and microscopic strains generally not exceeding 0.1% in nanomaterials.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 23413-2009 |
| CCS | X-ray, magnetic particle, fluorescence, and other nondestructive testing instruments |
| ICS | Non-destructive testing |
| Implement Date | 2009-12-01 |
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