T/CSTM 00751-2022 Active
T/CSTM 00751-2022 Microwave band solid state dielectrics material dielectric property testing closed-cavity method
Abstract
Scope: This document specifies the method of measuring the dielectric constant and loss tangent of solid dielectric and composite board materials in the frequency range of 1 GHz to 20 GHz using the closed-cavity method. Among them, the test range of dielectric constant is 5 to 100, and the test range of loss tangent is 0.00005 to 0.005. This document is applicable to the measurement of dielectric constant and loss tangent of inorganic materials such as silicon oxide, aluminum oxide, aluminum nitride, zirconium oxide, and boron nitride, and organic-inorganic composite materials that can be processed into cylindrical shapes. Main technical content: This document specifies the method of measuring the dielectric constant and loss tangent of solid dielectric and composite board materials in the frequency range of 1 GHz to 20 GHz using the closed-cavity method. Among them, the test range of dielectric constant is 5 to 100, and the test range of loss tangent is 0.00005 to 0.005. This document is applicable to the measurement of dielectric constant and loss tangent of inorganic materials such as silicon oxide, aluminum oxide, aluminum nitride, zirconium oxide, and boron nitride, and organic-inorganic composite materials that can be processed into cylindrical shapes.
General Product Information
| Document Type | Group standards |
|---|---|
| Standard Status | Active |
| Standard Code | T/CSTM 00751-2022 |
| CCS | Electronic components and information technology |
| ICS | Electronic components comprehensive |
| Implement Date | 2022-07-19 |