PDF
JJF 1916-2021 Active
JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Abstract
This specification is applicable to the calibration of scanning electron microscopes.
General Product Information
| Document Type | National Metrology Technical Specifications JJF |
|---|---|
| Standard Status | Active |
| Standard Code | JJF 1916-2021 |
| Implement Date | 2022-01-28 |
Price
$ 36
Subtotal
$ 36
Tax
$ 0.00
Order Total (incl. tax)
$ 36