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GB/T 13387-2009 Active
GB/T 13387-2009 Test method for measuring flat length wafers of silicon and other electronic materials
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 13387-2009 |
| CCS | Semi-metals and semiconductor materials |
| ICS | Semiconductor materials |
| Implement Date | 2010-06-01 |
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