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GB/T 15076.6-2020 Active
GB/T 15076.6-2020 Methods for chemical analysis of tantalum and niobium—Part 6:Determination of silicon content—Inductively coupled plasma atomic emission spectrometry
Abstract
This part of GB/T 15076 specifies the determination of silicon content in tantalum and niobium by inductively coupled plasma atomic emission spectrometry.
This part is applicable to the determination of silicon content in tantalum, niobium, and their hydroxides, oxides, carbides, and potassium tantalate. The determination range is 0.0005% to 0.50%.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 15076.6-2020 |
| CCS | Analysis methods for rare metals and their alloys |
| ICS | Other non-ferrous metals and their alloys |
| Implement Date | 2021-02-01 |
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