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GB/T 35003-2018 Active
GB/T 35003-2018 Test methods for endurance and data retention of non-volatile memory
Abstract
This standard specifies the methods for durability and data retention tests of non-volatile memory. This standard is applicable to electrically erasable programmable read-only memory (EEPROM), flash memory, and integrated circuits that incorporate the aforementioned memories (hereinafter referred to as devices).
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 35003-2018 |
| CCS | Semiconductor integrated circuits |
| ICS | Integrated circuits, microelectronics |
| Implement Date | 2018-08-01 |
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