T/JXNFS 004-2024 Determination of Multi-element Concentrations in the Chemical Analysis of Tantalum Iron and Nb Iron Ore Preparation and Mining Process Samples by Wavelength Dispersive X-Ray Fluorescence Spectroscopy

Scope

Main technical content: This document specifies the determination methods for the contents of tantalum pentoxide, niobium pentoxide, titanium dioxide, silicon dioxide, tungsten trioxide, manganese, tin, and sulfur in samples from the beneficiation process of tantalum iron and niobium iron concentrates. **Method 1**: Powder pressing method. The sample is prepared by powder pressing, and the components in the sample emit characteristic X-rays when excited by a wavelength-dispersive X-ray fluorescence spectrometer. After the spectral lines are overlapped and corrected for matrix effects, their intensities are proportional to the mass fraction of the component in the sample. By measuring the intensity of the characteristic X-rays of the target element in the sample, the mass fraction of each component can be quantitatively analyzed. **Method 2**: Molten glass slice method. The sample, internal standard, and mixed flux are mixed in a dilution ratio of 2:1:56, with lithium nitrate as the oxidizing agent and ammonium bromide as the demoulding agent. The sample slices are prepared by melting at 1150 °C. The X-ray fluorescence intensity of the target component (for tantalum pentoxide, the X-ray fluorescence intensity ratio of tantalum pentoxide to hafnium dioxide) is used to establish a calibration curve for the content of the target component. The content of the target component is calculated based on the calibration curve.

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