GB/T 4855-1984
Abolished
T/SICA 008-2025
Active
Group standards
T/SICA 008-2025 Semiconductor IBO Overlay Inspection Specification for Equipment Acceptance
T/SICA 008-2025 Semiconductor IBO overlay equipment acceptance specification
Price:
$ 20.00
Basic Information
Standard Code:
T/SICA 008-2025
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
Optical equipment
ICS Name:
Integrated circuits, microelectronics
Publish Date:
2025-06-03
Implement Date:
2025-07-03
Scope
Main technical content: This document specifies the technical requirements for the acceptance of overlay measurement equipment, including the structure and principle of graphic testing, the main parameters of equipment acceptance, and other aspects. This document is applicable to first-generation semiconductors represented by silicon (Si) and germanium (Ge), second-generation compound semiconductors represented by gallium arsenide (GaAs) and indium phosphide (InP), and third-generation semiconductors represented by silicon carbide (SiC) and gallium nitride (GaN).
Development Information
Related Standards
GB/T 3434-1986
Abolished
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB/T 3431.2-1986
Active
GB/T 3431.2-1986 Letter symbols for semiconductor integrated circuits—Letter symbols for function of pins
GB/T 6648-1986
Active
GB/T 6648-1986 Blank detail specification for semiconductor integrated circuit static read/write memories
GB/T 6800-1986
Abolished
GB/T 6800-1986 General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
GB/T 3435-1987
Abolished