SJ/T 10568-2020 Active Industry standards-Electronics

SJ/T 10568-2020 SJ/T 10568-2020 Electronic Component Detail Specification: CT2 type ceramic fixed capacitor. Evaluation Level: EZ

Publish Date: 2020-12-09 Implement Date: 2021-04-01 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

Price: $ 30

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Basic Information

Standard Code: SJ/T 10568-2020

Standard Type: Industry standards

Standard Status: Active

is_force_gb: no

CCS Name: Capacitor

ICS Name: Ceramic capacitors and mica capacitors

Publish Date: 2020-12-09

Implement Date: 2021-04-01

Scope

It is suitable for CT2 type ceramic dielectric fixed capacitors.

Development Information

Replace the following standards

SJ/T 10568-1994 Detail specification for electronic components fixed ceramic dielectric capacitors CTs Assessment level E

Related Standards

GB/T 3295-1996 Replaced

GB/T 3295-1996 Standard test method for 45°specular gloss of ceramic ware

Publish Date: 1996-06-25

GB/T 9325-1996 Abolished

GB/T 9325-1996 Fixed capacitors for use in electronic equipment—Part 10:Blank detail specification Fixed multilayer ceramic chip capacitors Assessment level E

Publish Date: 1996-07-09

GB/T 5968-1996 Replaced

GB/T 5968-1996 Fixed capacitors for use in electronic equipment Part 9:Sectional specification Fixed capacitors of ceramic dielectric, class 2

Publish Date: 1996-09-09

GB/T 5969-1996 Replaced

GB/T 5969-1996 Fixed capacitors for use in electronic equipment Part 9:Blank detail specification Fixed capacitor of ceramic dielectric, class 2 Assessment level E

Publish Date: 1996-09-09

GB/T 5966-1996 Replaced

GB/T 5966-1996 Fixed capacitors for use in electronic equipment Part 8:Sectional specification:Fixed capacitors of ceramic dielectric, class 1

Publish Date: 1996-11-12

GB/T 6261-1998 Active

GB/T 6261-1998 Fixed capacitors for use in electronic equipment—Part 5:Sectional specification Fixed mica dielectric d.c.capacitors with a rated voltage not exceeding 3000V Selection of methods of test and general requirements

Publish Date: 1998-11-02