GB/Z 118.1-2026 Photovoltaic modules—Extended-stress testing—Part 1:Modules

Scope

This document aims to provide information to supplement the basic qualification tests defined in GB/T 9535 with pass/fail criteria. This document provides a standardized test method for evaluating the long-term reliability of photovoltaic (PV) modules and the different bill of materials (BOMs) used to manufacture these modules. The test sequences included in this document are designed to provide information for qualitative comparative analysis, reproducing known failure modes using stresses related to outdoor exposure. Given that users may make decisions before obtaining test results if the test takes too long, the duration of the test is an important constraint. Under the above commercial constraints, some known failure modes, particularly those related to long-term ultraviolet (UV) exposure, cannot be accurately addressed. Although UV-related failure modes are known to occur on both the front and back sides of PV modules, the UV dose required to reproduce outdoor changes within the expected lifetime of the module under no excessive stress would take too long and is beyond the scope of this document. The UV stress sequence on the back side of the module air face in this document increases the confidence in certain cracking failures on the back side of the module air face, while the UV stress sequence on the back side of the module battery face is not included in this document at all, resulting in missing corresponding failure modes such as discoloration of the encapsulation film, cracking on the back side of the module battery face, and delamination on the battery face. Appendix A describes other limitations of enhanced stress tests. This document identifies the weaknesses of the module and does not attempt to collect information required for lifetime prediction, which would require identifying the failure mechanisms of the module and their correlation with all stresses. Appendix B includes a brief background on the sources of the tests. This document cannot be use

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