GB/T 45768-2025 Surface chemical analysis—Secondary ion mass spectrometry—Linearity of intensity scale in single ion counting time-of-flight mass analysers
GB/T 45768-2025 Surface chemical analysis—Secondary ion mass spectrometry—Linearity of intensity scale in single ion counting time-of-flight mass analysers
Basic Information
Scope
This document describes a method of determining the maximum acceptable count rate for intensity scale linearity deviations in a single-ion counting time-of-flight secondary ion mass spectrometer by measuring the isotope ratio in a polytetrafluoroethylene (PTFE)-based mass spectrometer. This document also includes a method of correcting intensity nonlinearity, which is caused by the loss of secondary ion intensity arriving at the microchannel plate (MCP) or scintillator and photomultiplier during dead time and subsequently entering the time-to-digital converter (TDC). This correction can increase the 95% linear intensity range by more than 50 times, so for those mass spectrometers where the validity of the relevant correction formula has been confirmed, a higher maximum count rate can be adopted.