T/SLDA 08-2024 Mini/Micro LED direct display module reliability test method

Scope

Scope: This document specifies the general test requirements for the reliability of Mini/Micro LED direct-view modules, the determination of test samples, test methods, and qualification criteria. This document applies to the reliability testing of Mini/Micro LED direct-view modules with a pixel pitch greater than or equal to 0.3 mm; Main technical content: This group standard proposes reliability testing methods for Mini/Micro LED direct-view modules with a pixel pitch greater than or equal to 0.3 mm. Based on China's geographical features and climatic environmental conditions, the indoor and outdoor working environments of Mini/Micro LED direct-view modules are divided into four categories. During the life cycle of Mini/Micro LED direct-view modules, including transportation, storage, and use, they are generally subjected to different mechanical and climatic environmental stresses. The standard sets requirements for the results of reliability testing under different environmental conditions. The standard specifies the preparation for reliability testing, including test environment conditions (standard atmospheric pressure conditions and arbitration test conditions), mechanical vibration, electromagnetic and photoelectric interference that affect test accuracy, the state requirements of the display modules, the general procedures for each environmental test, the items to be inspected during initial, intermediate, and final inspections, and the selection of suitable reliability test items for products based on the classification of working environments. This document proposes reliability testing methods for Mini/Micro LED direct-view modules, including temperature cycling, high-temperature storage, high-temperature operation, high-temperature-high humidity storage, high-temperature-high humidity operation, low-temperature storage, low-temperature operation, vibration, and salt spray. The standard emphasizes the reference to the corresponding test methods specified i

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