T/IAWBS 004-2017 Active Group standards

T/IAWBS 004-2017 General requirements and test methods for reliability testing of power semiconductor modules for electric vehicles

Publish Date: 2017-12-20 Implement Date: 2017-12-31 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/IAWBS 004-2017

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: Basic standards and general methods

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2017-12-20

Implement Date: 2017-12-31

Scope

Main technical content: This standard specifies the functional inspection requirements for power semiconductor modules used in electric vehicles before reliability testing, the general requirements during reliability testing, and the reliability testing methods. The power semiconductor modules applicable to this standard include, but are not limited to, insulated gate bipolar transistors (IGBTs), metal-oxide-semiconductor field-effect transistors (MOSFETs), and diode modules. This standard also stipulates the special testing requirements for wide bandgap semiconductor modules, such as silicon carbide-based MOSFETs. This standard can provide guidance for the reliability qualification testing of power semiconductor modules used in electric vehicles, as well as for their reliability design and inspection.