T/CES 219-2023 Long-term dynamic voltage fault screening and control decision-making technical specification for power systems

Scope

Scope: This document specifies the requirements, basic conditions, methods, and criteria for long-term dynamic voltage fault screening and control technology in power systems, as well as control measures to enhance stability and system design. This document applies to long-term dynamic voltage fault screening and control decision-making in power systems with voltages of 110 kV and above. Other voltage levels can be referenced for implementation. Main technical content: In large-scale power systems, the scale of the fault set that needs to be scanned is huge, but the proportion of serious faults that may lead to instability is very small. Therefore, it is necessary to screen the fault set and select serious faults from a large number of faults so as to make targeted control decisions. During the recovery process after a fault, or during the long transition period between faults, including slow recovery of loads and the characteristics of medium- and long-term dynamic components such as boilers and turbines, may have a negative impact on system stability. For example, the over-excitation limit action has a delay characteristic and may not be activated for a long time after a disturbance, often becoming a direct cause of voltage instability. Medium- and long-term dynamic simulation can identify faults that lead to medium- and long-term instability and should play an important role in the screening process of serious faults. However, at present, both at home and abroad, serious fault screening is carried out using static analysis or transient analysis methods, which fail to fully consider the possible long-term voltage instability caused by faults under the condition of including medium- and long-term dynamic components. Since long-term dynamic simulation includes medium- and long-term dynamic components and has a longer time scale than transient simulation, it takes a long time and is difficult to deal with large-scale fault sets. However, the possibility of medium

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