GB/T 3047.6-1986
Replaced
T/CS 012-2024
Active
Group standards
T/CS 012-2024 Wafer Test Probe Station
T/CS 012-2024 Wafer probing platform
Price:
$ 20.00
Basic Information
Standard Code:
T/CS 012-2024
Standard Type:
Group standards
Standard Status:
Active
is_force_gb:
no
CCS Name:
-
ICS Name:
Mechanical components for electronic devices
Publish Date:
2025-03-12
Implement Date:
2025-03-27
Scope
Scope: This document specifies the terms and definitions, parameters, general requirements, technical requirements, test methods, inspection rules, marking, packaging, transportation, and storage of wafer test probe stations. Main technical content: This document is applicable to the production and inspection of wafer test probe stations (hereinafter referred to as "probe stations").
Development Information
Related Standards
GB/T 6431-1986
Abolished
GB/T 6431-1986 Basic dimensions of narrow frame used for telecommunication equipment
GB/T 7423.1-1987
Active
GB/T 7423.1-1987 Heat sink of semiconductor devices Generic specification
GB/T 7423.2-1987
Active
GB/T 7423.2-1987 Heat sink of smiconductor devices Heat sink, extruded shapes
GB/T 7423.3-1987
Active
GB/T 7423.3-1987 Heat sink of semiconductor devices Heat sink, Staggered fingers shapes
GB/T 3047.2-1992
Abolished