T/CIE 070-2020 Active Group standards

T/CIE 070-2020 Industrial Grade High Reliability Integrated Circuit Evaluation Part 4: Non-Volatile Memory

T/CIE 070-2020 Industrial Grade High Reliability Integrated Circuit Evaluation Part 4: Non-Volatile Memory

Publish Date: 2020-06-08 Implement Date: 2020-08-15 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us
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Basic Information

Standard Code: T/CIE 070-2020
Standard Type: Group standards
Standard Status: Active
is_force_gb: no
CCS Name: Semiconductor integrated circuits
ICS Name: Electronic components comprehensive
Publish Date: 2020-06-08
Implement Date: 2020-08-15

Scope

Main technical content: This document specifies the detection requirements, detection methods, and inspection rules for flash memory chips (hereinafter referred to as chips) in industrial-grade high-reliability non-volatile memory devices, but does not cover ROM for the time being. This document is applicable to the identification, acceptance, and evaluation of industrial-grade high-reliability flash memory chips and embedded non-volatile memory chips

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