T/IAWBS 004-2021 Active Group standards

T/IAWBS 004-2021 General requirements and test methods for reliability testing of power semiconductor modules for electric vehicles

Publish Date: 2021-09-16 Implement Date: 2021-09-23 For services related to genuine standard inquiry, procurement, translation, and other related services in China, please Contact Us

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Basic Information

Standard Code: T/IAWBS 004-2021

Standard Type: Group standards

Standard Status: Active

is_force_gb: no

CCS Name: Basic standards and general methods

ICS Name: Integrated Components of Semiconductor Devices

Publish Date: 2021-09-16

Implement Date: 2021-09-23

Scope

Main technical content: This document specifies the functional inspection requirements, reliability test requirements, and test methods for power semiconductor devices used in electric vehicles. It also provides special test requirements for automotive wide-bandgap semiconductor devices, such as silicon carbide-based field-effect transistor devices. This document applies to power semiconductor devices (discrete devices or modules), including but not limited to insulated-gate bipolar transistors (IGBTs), metal-oxide field-effect transistors (MOSFETs), and diode devices. This document can provide guidance for the reliability type test of power semiconductor devices used in electric vehicles, as well as for their reliability design and inspection.