T/UNP 734-2025 半导体温差发电(TEG)器件测试方法
T/UNP 734-2025
基本信息
适用范围
主要技术内容:本标准针对半导体温差发电器件可靠性测试,涵盖机械应力、气候环境和使用寿命试验。机械应力试验包含机械冲击、振动、抗剪切等,考核器件结构强度;气候环境试验有高温、温度冲击等,评估环境适应能力;使用寿命试验基于阿伦尼乌斯方程推算器件寿命。每项试验均明确原理、设备、步骤及结果计算评估方式,适用于该类器件可靠性测试,确保其在多种条件下性能稳定。This standard focuses on the reliability testing of semiconductor thermoelectric generator (TEG)devices, covering mechanical stress tests, climatic environment tests, and service life tests.Mechanical stress tests include mechanical shock, vibration, and shear resistance to assess thedevice's structural strength. Climatic environment tests involve high temperature, thermal shock,etc., to evaluate environmental adaptability. The service life test estimates the device's lifespanbased on the Arrhenius equation. Each test specifies the principle, equipment, procedures,and result calculation/evaluation methods, suitable for reliability testing of such devices toensure stable performance under various conditions.
研制信息
起草单位:
湖北赛格瑞新能源科技有限公司、香河东方电子有限公司、河南鸿昌电子有限公司、浙江万谷半导体有限公司、武汉科技大学
起草人:
胡晓明、樊希安、陈树山、阚宗祥、陈建民、陈磊、符国庆、占荣全、胡浩、张帆