Standards

SJ 20207-1992 Abolished

SJ 20207-1992 Capacitors, fixed, electrolytic(non-solid electrolyte),tantalum hermetically sealed Type CAK35, established reliability, Detail specification for

Publish Date: 1992-11-19

SJ 20208-1992 Active

SJ 20208-1992 Detail specification for capacitors,Electrolytic (Solid eletrolyte),Tantalum, (nonpolarized, sintered slug), Established reliability,Type CAK70

Publish Date: 1992-11-19

SJ 20132-1992 Active

SJ 20132-1992 Technical requirements of mechanical assembling for military electronic equipments

Publish Date: 1992-11-19

SJ 20185-1992 Active

SJ 20185-1992 Semiconductor discrete device--Detail specification for silicon voltage reference diodes for Types 2DW232～236

Publish Date: 1992-11-19

SJ 20202-1992 Abolished

SJ 20202-1992 Detail specification capacitors, fixed, ceramic dielectric, established reliability, Type CTK403

Publish Date: 1992-11-19

SJ 20222-1992 Active

SJ 20222-1992 Potentiometers,Preset,Wire-wound,Lead-screw actuated,Style WT24,Detail specification for

Publish Date: 1992-11-19

SJ 20217-1992 Abolished

SJ 20217-1992 Potentiometers,Preset,Nonwire-wound,Lead-screw actuated,Style WJ24,Detail specification for

Publish Date: 1992-11-19

SJ 20211-1992 Active

SJ 20211-1992 Detail specification for capacitors,fixed,mica dielectric, established reliability,Type CYK2

Publish Date: 1992-11-19

SJ 20091-1992 Active

SJ 20091-1992 Detail specification for capacitors, fixed, ceramic dielectric, Type CT110

Publish Date: 1992-11-19

SJ 20160-1992 Active

SJ 20160-1992 Detail specification for types JT54S194 and JT54S195 SHIFT RFGISTERS of S-TTL semiconductor integrated circuits

Publish Date: 1992-11-19

SJ 20115.7-1992 Active

SJ 20115.7-1992 Environmental conditions and test methods for aircraft radar--Mechanical shock test

Publish Date: 1992-11-19

SJ 20055-1992 Active

SJ 20055-1992 Semiconductor discrete device--Detail specification for silicon NPN low power switching transistor of Type 3DK102

Publish Date: 1992-11-19