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SJ/T 11631-2016 Active
SJ/T 11631-2016 The testing method for surface defects of silicon wafers used in solar cells
General Product Information
| Document Type | Industry standards-Electronics |
|---|---|
| Standard Status | Active |
| Standard Code | SJ/T 11631-2016 |
| CCS | \nTest methods for the physical properties of metals |
| ICS | \nMetal material testing |
| Implement Date | 2016-09-01 |
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