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GB/T 14145-1993
GB/T 14145-1993 Test method for stacking fault density of epitaxial layers of silicon by interference-contrast microscopy
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Abolished |
| Standard Code | GB/T 14145-1993 |
| CCS | Metallographic examination methods |
| ICS | \nOn-board equipment and instruments |
| Implement Date | 1993-10-01 |
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