PDF
GB/T 17473.1-2008
GB/T 17473.1-2008 Test methods of precious metals pastes used for microelectronics—Determination of solids content
Abstract
This part specifies the test method for the solid content in precious metal pastes used in microelectronics technology. This part is applicable to the determination of the solid content in various sintered and cured precious metal pastes used in microelectronics technology.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Replaced |
| Standard Code | GB/T 17473.1-2008 |
| CCS | Precious metals and their alloys |
| ICS | Other non-ferrous metals and their alloys |
| Implement Date | 2008-09-01 |
Price
$ 36
Subtotal
$ 36
Tax
$ 0.00
Order Total (incl. tax)
$ 36