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GB/T 4060-2018 Active
GB/T 4060-2018 Test method for boron content in polycrystalline silicon by vacuum zone-melting method
Abstract
This standard specifies the test method for the base boron content in polycrystalline silicon. This standard is applicable to the determination of the base boron content in polycrystalline silicon rods deposited and grown on silicon cores. The measurement range of the base boron content (number of atoms) is 0.01×1013 cm-3 to 5×1015 cm-3.
General Product Information
| Document Type | National standards |
|---|---|
| Standard Status | Active |
| Standard Code | GB/T 4060-2018 |
| CCS | Analysis methods for semi-metallic and semiconductor materials |
| ICS | \nMetal material testing |
| Implement Date | 2019-06-01 |
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